Ion-tof公司

Web29 mrt. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering … The M6 Plus - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... SurfaceLab 7 - IONTOF - TOF-SIMS (time of flight secondary ion mass … The basic instrument is equipped with a reflectron TOF analyser giving high … Low Energy Ion Scattering - IONTOF - TOF-SIMS (time of flight secondary ion … With the Q Exactive TM extension for the M6, IONTOF provides the first … Service - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Sales - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Applications - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Web德国ion tof公司是目前国际tof-sims仪器主要生产商。 2003年,德国ion tof公司研发了第五代tof-sims仪器。 2005年,德国ion tof公司推出第一代bi源。 2010年,德国ion tof公司 …

Time-of-Flight Secondary Ion Mass Spectrometry NIST

WebIONTOF是一家拥有不同产品线的飞行时间二次离子质谱(TOF-SIMS)和高灵敏度低能离子散射(LEIS)的前沿表面分析仪器研究者和制造商。. IONTOF集团如今由四家公司分工 … WebUniversity of Texas at Austin how to sign off and email https://caraibesmarket.com

Interpretation of TOF‐SIMS data based on information entropy of spectra ...

WebIONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Web• TOF-SIMS: “ION-TOF IV” instrument. Ga-LMIS analytical source, 25 keV, high current bunched mode (typically m/∆m = 8000), analysis area 60×60 µm2. Sputter source Ar-EI, 3 keV, sputter area 200×200 µm2. Pulsed electron source for neutralisa-tion, 4×10–6 mbar argon flooding for sensitivity enhancement. Web13 apr. 2024 · 南京某科技公司将Vzense RGB-D ToF相机集成在军事考核评分系统中,用于检测士兵体能达标状况。 应用案例六. 牛羊数量检测. Vzense ToF相机在畜牧业养殖方 … nourished deakin

APi-TOF IONICON

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Ion-tof公司

Secondary Ion Mass Spectroscopy ION-TOF TOF.SIMS5 (SIMS)

WebIONTOF GmbH 622 volgers op LinkedIn. Advanced Ion Beam Technology for Surface Analysis. Innovative Ion Beam Technology for Surface Analysis IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometers (TOF-SIMS) and high-sensitivity low-energy ion …

Ion-tof公司

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Web3 jul. 2012 · 北京艾飞拓科技有限公司作为德国ION-TOF公司的中国总代理,成立于2012年。. 公司成员来自北京大学、中科院物理所等一流院校研究生。. 主要负责中国大陆及港澳地区的销售、售后、宣传、技术培训等工作。. “以物理学、材料学、国际贸易等专业背景打造的 ... Web我司作为德国ion-tof公司的中国总代理,成立于2012年。主要负责中国大陆及港澳地区的销售、售后、宣传、技术培训等工作。公司成员来自北京大学、中科院物理所等一流院校 …

WebThe ioniTOF mass analyzer is designed as a modular and flexible TOF-MS platform that allows you to choose the mass resolving power you need and also upgrade to higher resolution if you feel the need at a later stage of your experiments. The ioniTOF is available with mass resolutions ranging from 500 to even more than 10,000. WebAbout IONTOF GmbH: IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry …

Web主流的ToF相机厂商包括pmd、ams、ST、TI、Infineon、Sony、Optrima、微软等少数几家,其中pmd是一家能够提供户内、户外均能使用的ToF相机厂商,其产品具备多种探测距离,可适用于科研、工业和消费电子等多种场合;Optrima和微软的ToF相机主要面向家庭、娱乐应用,价格相对较低。 Pmd与Infineon Pmd的总部位于德国锡根,且在美国圣荷西、 … Web为了进一步简化谱图数据处理,IONTOF 为 M6 提供了各种工具,例如质谱图库,完全集成的多元统计分析(MVSA)软件包,以及强大性能的 Q ExactiveTM 功能扩展。 M6 TOF …

WebThe IONICON ioniAPi-TOF is a modular and robust Time-of-Flight mass spectrometer designed for the detection and mass analysis of ions generated at atmospheric pressure. …

Web刘看山 知乎指南 知乎协议 知乎隐私保护指引 应用 工作 申请开通知乎机构号 侵权举报 网上有害信息举报专区 京 icp 证 110745 号 京 icp 备 13052560 号 - 1 京公网安备 … nourished dynamicsWebTime-of-Flight Secondary Ion Mass Spectrometry, or TOF-SIMS, works by rastering a pulsed beam of focused primary ions across the area of interest, resulting in the emission of secondary ions which are characteristic of the materials present in the top several monolayers of the sample.By accurately measuring the masses of the detected ions they … how to sign off benefitsWeb北京艾飞拓科技有限公司作为德国ION-TOF公司的中国总代理,成立于2012年。 公司成员来自北京大学、中科院物理所等一流院校研究生。 主要负责中国大陆及港澳地区的销售、 … nourished defineWeb25 mei 2024 · IONTOF GmbH Heisenbergstr.15 48149 Münster Germany www.iontof.com Registergericht: Amtsgericht Münster, HRB 10680 Geschäftsführer: Dr. Ewald Niehuis … nourished designsWebThe TOF.SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF Company. Its design guarantees optimum performance in all fields of SIMS applications. The instruments offers three ion sources offering Bi1–7+, Cs+ and O2+ and is equipped with a reflectron TOF analyzer giving high secondary ion transmission with ... how to sign off gmail on iphoneWeb22 dec. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering … how to sign off facebook accountWebIONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry) - LEIS (low energy ion scattering). Ion beam technology products for surface spectrometry, surface analysis, depth profiling, surface imaging, 3D analysis, … nourished dsm